Paper on the reconfigurable atom chip trapping of atoms near cryogenic materials published in Appl. Phys. Lett. We demonstrate a novel atom chip trapping system that allows the placement and high-resolution imaging of ultracold atoms within microns from any <100 um-thin, UHV-compatible material, while also allowing sample exchange with minimal experimental downtime. The sample is not connected to the atom chip, allowing rapid exchange without perturbing the atom chip or laser cooling apparatus. Moreover, the decoupling of sample and atom chip provides the ability to independently tune the sample temperature from 300 to 35 K and below, while allowing the sample to scan with respect to the gas fixed at the focus of a high-resolution imaging system.